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High impedance probe hameg spectrum analyzer
GR: PRBEFPSPCTRMANAB PRBHIPSPCTRMANAB PRBMFPSPCTRMANAB
Picture 1 High Impedance Probe for SPECTRUM ANALYZER
(Batteries or Ni-Cads are not included)
Offered here is ONE (1 piece) of New excellent quality High Impedance Probe for HAMEG SPECTRUM ANALYZER - FREQUENCY SCANNER. Compatible with HZ530
High impedance probe can directly contact some connection points, or conductor of printed circuit board to test RF interference (RFI). The probe has very high resistance (similar to insulation resistance value of PCB), has only 2pF of load to the testing point of the circuit (80Ω at 1GHz). So it can directly contact to circuit and not influence to the circuit. For example, it can measure the quantitative effectiveness of filters or other blocking measures. The individual pins of IC can be considered as RFI sources. This probe can be used to trace the individual problem position in PCB. With high impedance probe, the specific test points of circuit can be connected to 50Ω input of spectrum analyzer (sold separately).
If you combine the above High Impedance Probe with the following which we sell separately (click on the icon),
the combination forms an ideal toolkit for the investigation of RF electromagnetic fields. They are indispensable for EMI pre-compliance testing during product development, prior to third party testing. All our 3 hand-held probes comes with a built-in pre-amplifier covering the frequency range from 100 kHz to over 1000 MHz. The probes - one magnetic field probe, one electric field probe, and one high impedance probe - are all matched to the 50W inputs of spectrum analyzers or RF-receivers. The power can be supplied either from batteries, Ni-Cads or through a power cord directly connected to a HAMEG HM5005 (HM-5005)/HM5006 (HM-5006)/HM5010 (HM-5010)/HM5011 (HM-5011)/HM5012 (HM-5012)/HM5014 (HM-5014) series spectrum analyzer.
Signal feed is via a 1.5m BNC-cable. When used in conjunction with a spectrum analyzer or a measuring receiver, the probes can be used to locate and qualify EMI sources, as well as evaluate EMC problems at the breadboard and prototype level. They enable the user to evaluate radiated fields and perform shield effectiveness comparisons. Mechanical screening performance and immunity tests on cables and components are easily performed.
REFUND POLICY / REPLACEMENT POLICY / RETURN POLICY:
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